Get In Touch
Dec2024 104x80.jpg
Current Issue
section
logo

FARO launches laser trackers

By Swati Deshpande,

Added 01 February 2017

The new products to address challenges in large-scale metrology

FARO RemoteControls also includes next generation functionality where the laser beam can be automatically re-established with a simple set of gestures, indoors or outdoors. This dramatically improves efficiency and productivity by eliminating the challenge of a broken laser beam and the need to manually reacquire the target. Finally, FARO RemoteControlsTM significantly reduces user training by dramatically increasing the ease of use for the operator.

Both FARO VantageS and FARO VantageE fully support FARO's patented Super 6DoF (Degrees of Freedom) TrackArm solution, which enables a Vantage Tracker and a FARO ScanArm®, or multiple ScanArms, to work together to create an integrated 3D measurement solution across a single coordinate system. Super 6DoF completely eliminates line-of sight challenges and significantly expands measurement range while maintaining superior accuracy with two instruments-in-one operation.

"The new FARO Vantage Laser Tracker product line is proven effective for the most environmentally challenging applications as it is tested to rigorous International Electrotechnical Commission (IEC) standards for shock and vibration, tested for extreme thermal conditions and is IP52 rated for dust and water resistance," stated Simon Raab, Ph.D., FARO's President and CEO.  "We are very conscious of our role as an innovator in this space, but we are even more conscious that it is our responsibility to innovate with the end user experience as the main driver.  The New Vantage Laser Tracker series provides a combination of innovation in usability along with value driven pricing that sets a new, highly accessible price/performance standard for laser trackers in large scale precision measurement. We are confident that the breakthroughs offered in the FARO Vantage platform will make it the go-to option for a variety of demanding factory metrology applications."

END